Research for the application of frequency modulation Interferometer to measure the deformation of aluminum alloy when temperature changes in optical devices
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https://doi.org/10.54939/1859-1043.j.mst.96.2024.124-130Keywords:
Frequency-modulated Interferometer; Deformation of materials; Aluminum alloy.Abstract
This article presents the theoretical foundation and application of a new method to measure the deformation of aluminum alloys due to temperature changes using a frequency-modulated interferometer (FMI). Aluminum alloys are important components, often used in manufacturing and mounting lenses for optical devices. When the temperature changes, the thickness and axial dimensions change according to the thermal expansion coefficient of the material, causing defocus that reduces the image quality of the optical device. Because the exact material used is often unknown in practice, it becomes difficult to precisely calculate the change caused by the thermal expansion coefficient. Therefore, a method to directly measure the material's actual deformation caused by temperature change is necessary to implement a temperature compensation solution from the design stage. The proposed FMI offers a simple structure and a new signal processing technique that can measure the small deformations of aluminum alloy with high accuracy under varying temperatures.
References
[1]. Тарасов В.В., Якушенков Ю.Г. “Инфракрасные системы “смотрящего” типа”. М: Логос, (2004).
[2]. G. Muyo and A. R. Harvey. “Wavefront Coding for Athermalization of Infrared Imaging Systems”, Electro-Optical and Infrared Systems: Technology and Applications, pp. 227–235, (2004). DOI: https://doi.org/10.1117/12.579738
[3]. Hoàng Anh Tú, Trần Quốc Tuấn, Lê Văn Đại, Đỗ Doanh Điện, “Nghiên cứu, tính toán sự thay đổi của chất lượng tạo ảnh của vật kính ảnh nhiệt khi nhiệt độ thay đổi và giải pháp chủ động cơ điện bù nhiệt”, Tạp chí Nghiên cứu KH&CN QS, số đặc san VĐT, (2020).
[4]. L M Barker, R E Hollenbach, "Interferometer Technique for Measuring the Dynamic Mechanical Properties of Materials," Review of Scientific Instruments, vol. 36, no. 11, pp. 1617-1620, (1965). DOI: https://doi.org/10.1063/1.1719405
[5]. N A Massie, R D Nelson, S Holly, "High-performance real-time heterodyne interferometry," Applied Optics, vol. 18, no. 11, pp. 1797-1803, (1979). DOI: https://doi.org/10.1364/AO.18.001797
[6]. Anh Tu Hoang, Thanh Tung Vu, Duc Quang Pham, Toan Thang Vu, Thanh Dong Nguyen, Van Huong Tran, “High precision displacement measuring interferometer based on the active modulation index control method” Measurement, vol 214, pages 112819-6, (2023). DOI: https://doi.org/10.1016/j.measurement.2023.112819
[7]. M. L. Meade, “Lock-In Amplifiers: Principles and Applications”, Inst of Engineering & Technology, (1983).
[8]. Vu, T. T., Maeda, Y., & Aketagawa, M. “Sinusoidal frequency modulation on laser diode for frequency stabilization and dis-placement measurement”. Measurement, 94, 927-933, (2016). DOI: https://doi.org/10.1016/j.measurement.2015.12.021
[9]. S. Cho, "Chapter 5 Lissajous Figures," in Numerical Calculation for Physics Laboratory Projects Using Microsoft EXCEL, Morgan & Claypool, (2019). DOI: https://doi.org/10.1088/2053-2571/ab318f
[10]. W. W. Bell, “Special Functions for Scientists and Engineers”, Massachusetts: Courier Corporation, (2004).
[11]. https://vi.wikipedia.org/wiki/. Độ_giãn_nở_nhiệt
